Share Email Print
cover

Proceedings Paper

Wyko Systems For Optical Metrology
Author(s): Katherine Creath
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

WYKO produces interferometer systems for a number of optical metrology applications. Systems to be discussed include: WISP, an interferogram analysis package that uses input from a graphics digitizing tablet or video camera; TOPO, a microscope system for profiling surfaces such as mirrors, hard disks, magnetic tape, and paint; SIRIS, used to test optical components ranging in size from a millimeter to meters; IR3, a 10.6 μm Twyman-Green interferometer for testing up to 16-in, diameter objects; LADITE, a wavefront analysis system whose major application is the testing of diode lasers; HOLOCAM, for quantitative holographic interferometry; and MAX, a projected fringe contouring system. All products but WISP use phase-measurement interferometry principles to obtain data. This paper gives the general operational principles of these systems and describes some of their applications and results.

Paper Details

Date Published: 23 March 1987
PDF: 17 pages
Proc. SPIE 0816, Interferometric Metrology, (23 March 1987); doi: 10.1117/12.941760
Show Author Affiliations
Katherine Creath, WYKO Corporation (United States)


Published in SPIE Proceedings Vol. 0816:
Interferometric Metrology
Norbert A. Massie, Editor(s)

© SPIE. Terms of Use
Back to Top