Share Email Print
cover

Proceedings Paper

Interferometric Testing Technology Developments And Applications In Japan
Author(s): Toyohiko Yatagai
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Research efforts for interferometric techniques and their applications in Japan are reviewed with an emphasis on recent developments. We will describe briefly digital fringe analysis techniques and theoretical approaches to precision phase analysis, and then practical applications of novel interferometers, holography, moire topography and optical fiber interferometry.

Paper Details

Date Published: 23 March 1987
PDF: 21 pages
Proc. SPIE 0816, Interferometric Metrology, (23 March 1987); doi: 10.1117/12.941756
Show Author Affiliations
Toyohiko Yatagai, University of Tsukuba (Japan)


Published in SPIE Proceedings Vol. 0816:
Interferometric Metrology
Norbert A. Massie, Editor(s)

© SPIE. Terms of Use
Back to Top