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Proceedings Paper

Metrological Grating Technology Developments
Author(s): Huang Shang-lian
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Paper Abstract

This paper concerns the work of the Opto-Electronic Precision Machinery Laboratory on the moire principle, manufacture, calibration, and application of radial and linear metrological gratings.

Paper Details

Date Published: 9 February 1987
PDF: 7 pages
Proc. SPIE 0815, Application and Theory of Periodic Structures, Diffraction Gratings, and Moire Phenomena III, (9 February 1987); doi: 10.1117/12.941751
Show Author Affiliations
Huang Shang-lian, Clionqing University (China)


Published in SPIE Proceedings Vol. 0815:
Application and Theory of Periodic Structures, Diffraction Gratings, and Moire Phenomena III
Jeremy M. Lerner, Editor(s)

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