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Proceedings Paper

Fringe Visibility In Electronic Speckle Pattern Interferometry
Author(s): Motoki Yonemura; Shigeru Hagihara
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Paper Abstract

In electronic speckle pattern interferometry, the visibility of resultant fringes are influenced by inhomogeneity of the object light and the reference light. Moreover, the resultant fringes have granularity, which is the drawback of ESPI. Two methods to improve the visibility of resultant fringes are proposed. One is a normalizing method and another is a phase scanning method. The experiments were carried out using a CCD image sensor, a digital frame memory and a 16-bit micro-computer, and the theoretical considerations were verified.

Paper Details

Date Published: 17 February 1987
PDF: 5 pages
Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); doi: 10.1117/12.941719
Show Author Affiliations
Motoki Yonemura, Yamanashi University (Japan)
Shigeru Hagihara, Yamanashi University (Japan)


Published in SPIE Proceedings Vol. 0814:
Photomechanics and Speckle Metrology
Fu-Pen Chiang, Editor(s)

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