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Proceedings Paper

Moire Strain Gauge With High Sensitivity
Author(s): F. P. Chiang; C. L . Yuan; R. Krishnamurth
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Paper Abstract

A microcomputer based moire strain gauge with high sensitivity is developed which is capable of measuring strain automatically .

Paper Details

Date Published: 17 February 1987
PDF: 6 pages
Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); doi: 10.1117/12.941715
Show Author Affiliations
F. P. Chiang, The State University of New York at Stony Brook (United States)
C. L . Yuan, The State University of New York at Stony Brook (United States)
R. Krishnamurth, The State University of New York at Stony Brook (United States)


Published in SPIE Proceedings Vol. 0814:
Photomechanics and Speckle Metrology
Fu-Pen Chiang, Editor(s)

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