Proceedings PaperAssessment Of Silicon Imaging Array Performance
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The increasing use of solid-state array image sensors such as CCDs, CIDs and photodiode arrays, brings new aspects to the design and assessment of imaging systems. Some of the traditional image degradation mechanisms associated with tubes are still present, such as the temporal noise and limited resolution, and their effects on MTF and visibility. New problems include particularly the element-to-element non-uniformities in response and dark current which lead to structure on the picture and cause errors in systems with automatic image processing. These exhibit complex behaviour with temperature and wavelength, and give rise to complex calibration requirements. Many properties must be measured, some under varying environmental conditions, in order to fully characterise such arrays. The paper gives a broad description of the principal properties, their dependences on various conditions, and the testing methods employed, together with examples of typical results.