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Proceedings Paper

Infrared Diffuse Reflectometer For Spectral, Angular And Temperature Resolved Measurements
Author(s): Leonard M. Hanssen; Keith A. Snail
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Paper Abstract

This paper describes an integrating sphere - Fourier Transform Spectrophotometer (FTS) instrument and its measurements of directional hemispherical reflectance as a function of angle, temperature and wavelength in the infrared. Samples can be mounted in the center of the sphere or on the wall of the sphere. The center mounted samples can be tilted to vary the beam incidence angle from 0° to 60°; wall mounted samples can be heated to temperatures of 250°C. Measurements on samples using both sample mounts are presented and compared. A discussion of the measurement techniques used to obtain round robin results (presented in an accompanying paper) is also given. A study of the temperature dependence of a single round robin sample is presented. Detailed measurements of a ruled gold sample are given and the importance of the detector's field-of-view in explaining this data is demonstrated with a simple experiment.

Paper Details

Date Published: 10 September 1987
PDF: 12 pages
Proc. SPIE 0807, Passive Infrared Systems and Technology, (10 September 1987); doi: 10.1117/12.941451
Show Author Affiliations
Leonard M. Hanssen, Naval Research Laboratory (United States)
Keith A. Snail, Naval Research Laboratory (United States)


Published in SPIE Proceedings Vol. 0807:
Passive Infrared Systems and Technology
H. M. Lamberton, Editor(s)

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