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Proceedings Paper

Measurement Of Surface Profile Changes By The Use Of Moire Fringes With Particular Application To Mass Transfer
Author(s): Monica Flanagan; Dennis Wilcock; Catherine Wykes
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Paper Abstract

The use of Moire fringes for the measurement of mass transfer is reported. In this application, changes in surface profile on a naphthalene plate due to mass transfer take place. The profile changes are measured using Moire fringes and the results are compared with an existing measuring device which uses a height sensitive stylus. Fringe patterns are illustrated on both flat and cylindrical surfaces.

Paper Details

Date Published: 28 September 1987
PDF: 8 pages
Proc. SPIE 0805, Optical Components and Systems, (28 September 1987); doi: 10.1117/12.941381
Show Author Affiliations
Monica Flanagan, Coventry Lanchester Polytechnic (U.K.)
Dennis Wilcock, Coventry Lanchester Polytechnic (U.K.)
Catherine Wykes, University of Nottingham (U.K.)


Published in SPIE Proceedings Vol. 0805:
Optical Components and Systems
Andre Masson, Editor(s)

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