Share Email Print

Proceedings Paper

Measurement Of Surface Profile Changes By The Use Of Moire Fringes With Particular Application To Mass Transfer
Author(s): Monica Flanagan; Dennis Wilcock; Catherine Wykes
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The use of Moire fringes for the measurement of mass transfer is reported. In this application, changes in surface profile on a naphthalene plate due to mass transfer take place. The profile changes are measured using Moire fringes and the results are compared with an existing measuring device which uses a height sensitive stylus. Fringe patterns are illustrated on both flat and cylindrical surfaces.

Paper Details

Date Published: 28 September 1987
PDF: 8 pages
Proc. SPIE 0805, Optical Components and Systems, (28 September 1987); doi: 10.1117/12.941381
Show Author Affiliations
Monica Flanagan, Coventry Lanchester Polytechnic (U.K.)
Dennis Wilcock, Coventry Lanchester Polytechnic (U.K.)
Catherine Wykes, University of Nottingham (U.K.)

Published in SPIE Proceedings Vol. 0805:
Optical Components and Systems
Andre Masson, Editor(s)

© SPIE. Terms of Use
Back to Top