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Proceedings Paper

Characterization Of Single Crystal Cu[sub]2[/sub]S/CdS Heterojunctions By High Resolution Electron Microscopy
Author(s): T. Sands; R. Gronsky; J. Washburn
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Paper Abstract

The effect of CdS surface orientation on the phase distribution and morphology of the Cu2S/CdS heterojunction has been investigated. The first high resolution transmission electron microscope (HRTEM) images of Cu2S/CdS interfaces reveal the presence of the metastable tetragonal phase in heterojunctions formed in terraced CdS surfaces. This observation is rationalized by considering i) the effects of lattice misfit, and ii) the factors influencing the nucleation of h.c.p.-to-f.c.c. transformation dislocations. The implications of this result for the reproducible fabrication of high efficiency Cu2S/CdS solar cells are discussed.

Paper Details

Date Published: 31 May 1984
PDF: 6 pages
Proc. SPIE 0463, Advanced Semiconductor Processing/Characterization of Electronic/Optical Materials, (31 May 1984); doi: 10.1117/12.941348
Show Author Affiliations
T. Sands, University of California (United States)
R. Gronsky, University of California (United States)
J. Washburn, University of California (United States)


Published in SPIE Proceedings Vol. 0463:
Advanced Semiconductor Processing/Characterization of Electronic/Optical Materials
Carl M. Lampert; Devindra K. Sadana, Editor(s)

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