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Proceedings Paper

Testing Monolithic GaAs MMIC Circuits
Author(s): Allen Podell; Doug Lockie
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Paper Abstract

Testing microwave circuits is difficult because of the pronounced effects of stray capacitance and inductance, and because of the problems caused by electromagnetic energy reflected from circuit impedance discontinuities (VSW effects). Monolithic Microwave Integrated Circuits (MMICs) present additional problems of a semiconductor implementation nature.

Paper Details

Date Published: 2 February 1988
PDF: 5 pages
Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); doi: 10.1117/12.940965
Show Author Affiliations
Allen Podell, Pacific Monolithics, Inc. (United States)
Doug Lockie, Pacific Monolithics, Inc. (United States)


Published in SPIE Proceedings Vol. 0795:
Characterization of Very High Speed Semiconductor Devices and Integrated Circuits
Ravinder K. Jain, Editor(s)

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