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Proceedings Paper

Electro-Optic Sampling In Gallium Arsenide
Author(s): Brian H. Kolner
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Paper Abstract

Electro-optic sampling uses short optical pulses to measure high-speed electrical waveforms propagating in electro-optic crystals. Since GaAs is electro-optic, a perfect application of this technique is the noninvasive probing of signals propagating in devices and circuits made in this and related compound semiconductors. Principles, limitations and applications to high-speed circuit characterization will be discussed.

Paper Details

Date Published: 2 February 1988
PDF: 7 pages
Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); doi: 10.1117/12.940952
Show Author Affiliations
Brian H. Kolner, Hewlett-Packard Laboratories (United States)


Published in SPIE Proceedings Vol. 0795:
Characterization of Very High Speed Semiconductor Devices and Integrated Circuits
Ravinder K. Jain, Editor(s)

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