Share Email Print
cover

Proceedings Paper

Cross-Talk And Transit-Time Effects In Stroboscopic Voltage Measurements Via Electron Emission
Author(s): R. Clauberg; A. Blacha; H. Beha
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The dependence on geometry, extraction field, electron start energy, and rise time of the input signal is investigated for the transit-time and cross-talk effects in stroboscopic voltage measurements via electron emission. The investigation yields information about the best achievable time resolution and the disturbance of measured signals by signals on neighboring conductors in corresponding contactless voltage-measuring techniques like photoemission sampling and electron-beam sampling.

Paper Details

Date Published: 2 February 1988
PDF: 7 pages
Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); doi: 10.1117/12.940944
Show Author Affiliations
R. Clauberg, Zurich Research Laboratory (Switzerland)
A. Blacha, Zurich Research Laboratory (Switzerland)
H. Beha, Zurich Research Laboratory (Switzerland)


Published in SPIE Proceedings Vol. 0795:
Characterization of Very High Speed Semiconductor Devices and Integrated Circuits
Ravinder K. Jain, Editor(s)

© SPIE. Terms of Use
Back to Top