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Proceedings Paper

Ultrahigh Speed Evaluation Of GaAs ICs For Engineering Characterization And Production Test: Problems And Approaches
Author(s): Richard C. Eden; J. Elwood Clarke
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Paper Abstract

The ac characterization of ultra high speed digital GaAs ICs in which the total input pad to output pad logic signal propagation delays are in the 100ps to 1000ps range for typical 'NISI to LSI functions represents a challenge well beyond the capabilities of present commercial IC testers. This paper reviews techniques developed at GigaBit Logic for the high speed evaluation of GaAs ICs, both for detailed engineering characterization of new product designs, and for the much more rapid, high volume production testing of commercial GaAs IC's.

Paper Details

Date Published: 2 February 1988
PDF: 7 pages
Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); doi: 10.1117/12.940932
Show Author Affiliations
Richard C. Eden, GigaBit Logic. Inc. (United States)
J. Elwood Clarke, GigaBit Logic, Inc. (United States)

Published in SPIE Proceedings Vol. 0795:
Characterization of Very High Speed Semiconductor Devices and Integrated Circuits
Ravinder K. Jain, Editor(s)

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