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Proceedings Paper

Photoreflectance Characterization Of Microstructures Using A Dye Laser System
Author(s): O. J. Glembocki; B. V. Shanabrook
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Paper Abstract

The optical characterization technique of photoreflectance (PR) has been modified by replacing the source of the probe light with a dye laser. This has allowed easy access to temperatures below 100K, a temperature range in which it was previously difficult to measure a PR spectrum. This system is also capable of simultaneous photoluminescence excitation spectroscopy (PLE). The combined PR/PLE apparatus has allowed us to obtain information regarding the nature of the PR signal.

Paper Details

Date Published: 22 April 1987
PDF: 7 pages
Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); doi: 10.1117/12.940895
Show Author Affiliations
O. J. Glembocki, U.S. Naval Research Laboratory (United States)
B. V. Shanabrook, U.S. Naval Research Laboratory (United States)


Published in SPIE Proceedings Vol. 0794:
Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
Orest J. Glembocki; Fred H. Pollak; Jin-Joo Song, Editor(s)

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