Share Email Print
cover

Proceedings Paper

Time-Resolved Thermal And Acoustic Pulse-Echo Measurements In Condensed Matter
Author(s): Gary L. Eesley; Carolyn A. Paddock; Bruce M. Clemens
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An optical transient reflectance technique has been developed to characterize both the thermal and elastic properties of thin film materials. By using picosecond duration laser pulses, films on the order of 100 nm thick can be studied. Measurements of the thermal diffusivity, interfacial thermal impedance and acoustic velocity in thin, supported metal films are discussed.

Paper Details

Date Published: 22 April 1987
PDF: 4 pages
Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); doi: 10.1117/12.940888
Show Author Affiliations
Gary L. Eesley, General Motors Research Laboratories (United States)
Carolyn A. Paddock, General Motors Research Laboratories (United States)
Bruce M. Clemens, General Motors Research Laboratories (United States)


Published in SPIE Proceedings Vol. 0794:
Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
Orest J. Glembocki; Fred H. Pollak; Jin-Joo Song, Editor(s)

© SPIE. Terms of Use
Back to Top