Share Email Print
cover

Proceedings Paper

Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal Approach
Author(s): Nabil M. Amer
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Photothermal spectroscopy employs the small rise in temperature associated with the absorption of electromagnetic radiation to probe optical and transport properties of materials. A review of the various photothermal detection schemes is given, and examples which illustrate the power of this technique are reviewed.

Paper Details

Date Published: 22 April 1987
PDF: 9 pages
Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); doi: 10.1117/12.940885
Show Author Affiliations
Nabil M. Amer, IBM Thomas J. Watson Research Center (United States)


Published in SPIE Proceedings Vol. 0794:
Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
Orest J. Glembocki; Fred H. Pollak; Jin-Joo Song, Editor(s)

© SPIE. Terms of Use
Back to Top