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Proceedings Paper

Optimal Performance Of An Electro-Optical Sampler
Author(s): Jeffrey Lindemuth
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Paper Abstract

An electro-optical sampler is used to measure the electric potential generated by a device under test. However, the sampler actually measures the change in polarization of a laser beam in the electro-optic crystal, caused by the electric field from striplines to which the device has been connected. In order to relate this measured effect to the actual potential produced by the device, it is necessary to have a detailed knowledge of the stripline characteristics. It will be shown that in a typical three strip geometry, the half wave voltage can vary by 10% across the striplines due to curved electric fields.

Paper Details

Date Published: 3 August 1987
PDF: 5 pages
Proc. SPIE 0793, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors, (3 August 1987); doi: 10.1117/12.940872
Show Author Affiliations
Jeffrey Lindemuth, EG&G Princeton Applied Research (United States)

Published in SPIE Proceedings Vol. 0793:
Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors
Robert R. Alfano, Editor(s)

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