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Proceedings Paper

Simplified Pattern Recognition Based On Multiaperture Optics
Author(s): Richard T. Schneider; Shih-Chao Lin
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Paper Abstract

Multiaperture optics systems are similar in design to the concepts applying to the insect eye. Digitizing at the detector level is inherent in these systems. The fact that each eyelet forms one pixel of the overall image lends itself to optical preprocessing. There-fore a simplified pattern recognition scheme can be used in connection with multiaperture optics systems. The pattern recognition system used is based on the conjecture that all shapes encountered can be dissected into a set of rectangles. This is accomplished by creating a binary image and comparing each row of numbers starting at the top of the frame with the next row below. A set of rules is established which decides if the binary ones of the next row are to be incorporated in the present rectangle or start a new rectangle. The number and aspect ratios of the rectangles formed constitute a recognition code. These codes are kept and updated in a library. Since the same shape may give rise to different recognition codes depending on the attitude of the shape in respect to the detector grid, all shapes are rotated and normalized prior to dissecting. The rule is that the pattern is turned to maximize the number of straight edges which line up with the detector grid. The mathematical mechanism for rotation of the shape is described. Assuming a-priori knowledge of the size of the object exists, the normalization procedure can be used for distance determination. The description of the hardware for acquisition of the image is provided.

Paper Details

Date Published: 11 May 1987
PDF: 7 pages
Proc. SPIE 0786, Applications of Artificial Intelligence V, (11 May 1987); doi: 10.1117/12.940650
Show Author Affiliations
Richard T. Schneider, University of Florida (United States)
Shih-Chao Lin, University of Florida (United States)

Published in SPIE Proceedings Vol. 0786:
Applications of Artificial Intelligence V
John F. Gilmore, Editor(s)

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