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Proceedings Paper

An Investigation Into The Factors Affecting Infrared Temperature Measurements For Building Applications
Author(s): Y. May Chang
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Paper Abstract

Various factors affecting infrared temperature measurements are discussed. Temperature calibration curves at surrounding temperatures between -20°C and 25°C are presented for two infrared imaging systems operating in the 2 to 5 μm and 8 to 14 μm wavelength regions. The calibration curves for the 2 to 5 μm system were found to be independent to surrounding temperatures, while the calibration curves for the 8 to 14 μm system were found to be strongly dependent to surrounding temperatures. Equations to account for changes in surrounding temperatures are presented. Laboratory measurements of emissivity using both systems at different surrounding temperatures (22°C, 4°C, and -11°C) are given for several typical building materials. The emissivity measurements are used in computing surface temperatures of the materials. Comparisons are made between predicted and measured surface temperatures.

Paper Details

Date Published: 11 May 1987
PDF: 8 pages
Proc. SPIE 0780, Thermosense IX: Thermal Infrared Sensing for Diagnostics and Control, (11 May 1987); doi: 10.1117/12.940486
Show Author Affiliations
Y. May Chang, National Bureau of Standards (United States)


Published in SPIE Proceedings Vol. 0780:
Thermosense IX: Thermal Infrared Sensing for Diagnostics and Control
Robert P. Madding, Editor(s)

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