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Proceedings Paper

Space Charge Limited Currents (SCLC) In Amorphous Hydrogenated Silicon (A-Si:H)
Author(s): Enakshi Bhattacharya
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Paper Abstract

Space charge limited current measurement has emerged as a simple dependable spectroscopy to study the gap states in a-Si:H. In this paper we discuss this measurement along with its sensitivity, advantages and disadvantages.

Paper Details

Date Published: 21 August 1987
PDF: 8 pages
Proc. SPIE 0763, Physics of Amorphous Semiconductor Devices, (21 August 1987); doi: 10.1117/12.940159
Show Author Affiliations
Enakshi Bhattacharya, Solar Energy Research Institute (United States)


Published in SPIE Proceedings Vol. 0763:
Physics of Amorphous Semiconductor Devices
David Adler, Editor(s)

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