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Proceedings Paper

Error Specification For Stereo Imaging
Author(s): Ziad Yammine; Bok W. Lee; Joseph H. Nurre; Ernest L. Hall
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Paper Abstract

Stereo vision measurement is useful for applications in inspection and could lead to the integration of the inspection task into the manufacturing process, resulting in an improvement in product quality. In this paper, an analysis for an inspection cell using single-image stereo vision is described and the practical problems and error sources are discussed. This paper also presents the error specifications for designing a system accurate to within .001 inch.

Paper Details

Date Published: 21 August 1987
PDF: 6 pages
Proc. SPIE 0754, Optical and Digital Pattern Recognition, (21 August 1987); doi: 10.1117/12.939962
Show Author Affiliations
Ziad Yammine, University of Cincinnati (United States)
Bok W. Lee, University of Cincinnati (United States)
Joseph H. Nurre, University of Cincinnati (United States)
Ernest L. Hall, University of Cincinnati (United States)


Published in SPIE Proceedings Vol. 0754:
Optical and Digital Pattern Recognition
Hua-Kuang Liu; Paul S. Schenker, Editor(s)

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