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Proceedings Paper

Application Of Synchrotron Radiation To X-Ray Fluorescence Analysis Of Trace Elements
Author(s): B M Gordon; K W Jones; A L Hanson
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Paper Abstract

The development of synchrotron radiation x-ray sources has provided the means to greatly extend the capabilities of x-ray fluorescence analysis for determinations of trace element concentrations. A brief description of synchrotron radiation properties provides a background for a discussion of the improved detection limits compared to existing x-ray fluorescence techniques. Calculated detection limits for x-ray microprobes with micrometer spatial resolutions are described and compared with experimental results beginning to appear from a number of laboratories. The current activities and future plans for a dedicated x-ray microprobe beam line at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory are presented.

Paper Details

Date Published: 9 March 1987
PDF: 7 pages
Proc. SPIE 0681, Laser and Nonlinear Optical Materials, (9 March 1987); doi: 10.1117/12.939624
Show Author Affiliations
B M Gordon, Brookhaven National Laboratory (United States)
K W Jones, Brookhaven National Laboratory (United States)
A L Hanson, Brookhaven National Laboratory (United States)


Published in SPIE Proceedings Vol. 0681:
Laser and Nonlinear Optical Materials
Larry G. DeShazer, Editor(s)

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