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Proceedings Paper

Application Of Fourier Optical Signal Processing To Detect Surface Flaws In Transmissive And Reflective Materials
Author(s): Mary P Thomas; Timothy Day; Tracy Kubo
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Paper Abstract

The use of two-dimensional Fourier optical signal processing has been applied to the field of surface defect detection. Both transmissive and reflective objects can be analyzed using this system. The object is placed in a coherent optical processing system. By selectively blocking information in the frequency spectrum which contribute to background light and noise levels, only information relating to physical defects in the test object will be observed at the output plane of the system. The system has been observed to be relatively impervious to mechanical vibration, allows for the inspection of large areas instantaneously, and has relatively good resolution.

Paper Details

Date Published: 23 March 1987
PDF: 6 pages
Proc. SPIE 0680, Surface Characterization and Testing, (23 March 1987); doi: 10.1117/12.939607
Show Author Affiliations
Mary P Thomas, Western Research Corp. (United States)
Timothy Day, San Diego State University (United States)
Tracy Kubo, San Diego State University (United States)

Published in SPIE Proceedings Vol. 0680:
Surface Characterization and Testing
Katherine Creath, Editor(s)

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