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Proceedings Paper

Real-Time Snapshot Interferometer
Author(s): Joseph L McLaughlin; Bruce A Horwitz
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Paper Abstract

A compact, no-moving-parts, dc-phase-measuring interferometer has been designed and manufactured. This interferometer was designed to provide high-density sampling, high-accuracy wavefront measurements under adverse conditions. A crossed grating shearing interferometer technique has been utilized where all data is simultaneously collected on a single fixed detector array. This highly stable configuration provides a means of obtaining phase information using cw, shuttered (1 to 10-3 sec), or ultra-short-pulsed sources. This self-contained instrument can be used to take large numbers of interferograms quickly and reduce their data efficiently to obtain wavefront constructions.

Paper Details

Date Published: 23 March 1987
PDF: 9 pages
Proc. SPIE 0680, Surface Characterization and Testing, (23 March 1987); doi: 10.1117/12.939589
Show Author Affiliations
Joseph L McLaughlin, Itek Optical Systems (United States)
Bruce A Horwitz, Itek Optical Systems (United States)


Published in SPIE Proceedings Vol. 0680:
Surface Characterization and Testing
Katherine Creath, Editor(s)

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