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Proceedings Paper

Detector Responsivity Determination Using Pinhole Diffraction
Author(s): Lawrence D Brooks
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Paper Abstract

A simple but accurate method is described for calibrating detector responsivity The method involves creating a far-field intensity pattern via diffraction from a circular aperture, and then computing the integrated irradiance over the detector area using well-known relations. No experimental verification has been performed, but several error sources are discussed and are expected to be small.

Paper Details

Date Published: 19 December 1986
PDF: 8 pages
Proc. SPIE 0679, Current Developments in Optical Engineering and Diffraction Phenomena, (19 December 1986); doi: 10.1117/12.939583
Show Author Affiliations
Lawrence D Brooks, Rockwell International (United States)


Published in SPIE Proceedings Vol. 0679:
Current Developments in Optical Engineering and Diffraction Phenomena
Robert E. Fischer; James E. Harvey; Warren J. Smith, Editor(s)

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