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Proceedings Paper

Analysis Of The All-Specular Linlor Baffle Design
Author(s): Alan W Greynolds; Ramsey K Melugin
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Paper Abstract

This paper presents the results of a full three-dimensional analysis of a new type of reflecting baffle vane cavity proposed by Dr. William Linlor of NASA's Ames Research Center. The analysis is divided into two separate parts. The first employs advanced geometrical ray tracing techniques (the ASAP/RABET computer program) to the analyze the specular reflecting properties of the cavities. The second part uses deterministic radiation transfer methods (a later version of the APART/PADE stray radiation analysis program) to analyze the diffuse scattering properties of the reflecting cavities relative to absorbing ones. In both cases, an operating wavelength of 10.6 microns is initially used. These results are then used to estimate the performance at 2.0 microns.

Paper Details

Date Published: 3 June 1987
PDF: 9 pages
Proc. SPIE 0675, Stray Radiation V, (3 June 1987); doi: 10.1117/12.939501
Show Author Affiliations
Alan W Greynolds, Breault Research Organization, Inc. (United States)
Ramsey K Melugin, NASA Ames Research Center (United States)


Published in SPIE Proceedings Vol. 0675:
Stray Radiation V
Robert P. Breault, Editor(s)

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