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Proceedings Paper

Effects Of Surface And Bulk Defects In Transmitting Materials On Optical Resolution And Scattered Light
Author(s): H E Bennett; D W Ricks
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Paper Abstract

The origin of scattered light, particularly near-angle scattered light, and its effect on optical resolution have been analyzed. Also, an instrument is described that can measure near-angle scatter. An application of Rayleigh and Mie scattering theories shows that a few large defects cause a high level of near-angle scatter, which leads to a loss of resolution. The degradation in resolution is severe when trying to resolve a bright object near a faint object. A relatively simple apparatus has been built that can measure near-angle scatter at angles as small as 0.03 degrees and at levels of 10-6 peak intensity.

Paper Details

Date Published: 3 June 1987
PDF: 7 pages
Proc. SPIE 0675, Stray Radiation V, (3 June 1987); doi: 10.1117/12.939495
Show Author Affiliations
H E Bennett, Michelson Laboratory (United States)
D W Ricks, Michelson Laboratory (United States)


Published in SPIE Proceedings Vol. 0675:
Stray Radiation V
Robert P. Breault, Editor(s)

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