Share Email Print
cover

Proceedings Paper

Real Time Pattern Recognition And Feature Analysis From Video Signals Applied To Eye Movement And Pupillary Reflex Monitoring
Author(s): Jacques R. Charlier; Jean-Luc Bariseau; Vincent Chuffart; Frangoise Marsy; Jean-Claude Hache
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Original techniques for real time pattern recognition and feature analysis from standard video signals have been developed. These techniques have been applied to the monitoring of eye movements and pupillary size during visual field and electrophysio-logical examinations in routine ophtalmological practice. The basic features of the resulting instrument are : 1- the use of low-cost hardware, i.e. standard video equipment and LSI circuitry. 2- the measurement of eye, orientation from the position of the bright pupil relative to the corneal reflection. 3- "real time" processing and high data throughout of 50 samples per second, allowing pupillary and oculomotor reflex analysis. 4- specialized hardware and software permitting an adjustment free feature identifica-tion and analysis directly from video signals. Severe perturbations of the ocular video images can be handled by the system, including partial occlusions of the pupil with eye lids or eye lashes, fluctuations of amplitude levels and parasite light reflections.

Paper Details

Date Published: 15 June 1984
PDF: 8 pages
Proc. SPIE 0454, Application of Optical Instrumentation in Medicine XII, (15 June 1984); doi: 10.1117/12.939317
Show Author Affiliations
Jacques R. Charlier, ESSILOR INTERNATIONAL and C.T.B (France)
Jean-Luc Bariseau, C.T.B (France)
Vincent Chuffart, I.S.E.N (France)
Frangoise Marsy, I.S.E.N (France)
Jean-Claude Hache, Centre Hospitalier (France)


Published in SPIE Proceedings Vol. 0454:
Application of Optical Instrumentation in Medicine XII
Samuel J. Dwyer; Roger H. Schneider, Editor(s)

© SPIE. Terms of Use
Back to Top