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Proceedings Paper

Picosecond And Femtosecond Diagnostics Of Semiconductors
Author(s): E. Wintner; J. G. Fujimoto; E. P. Ippen
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Paper Abstract

Ultrashort light pulses are used to study carrier dynamics in highly excited semiconductor materials. Picosecond pulses from a cw modelocked Nd:YAG laser create carriers and probe nonlinear (Auger) recombination in InGaAs and InGaAsP epilayers. Femtosecond continuum pulses from a dye oscillator/amplifier system monitor the spectral dynamics of free excitons in CdSe following optical excitation.

Paper Details

Date Published: 10 May 1984
PDF: 4 pages
Proc. SPIE 0452, Spectroscopic Characterization Techniques for Semiconductor Technology I, (10 May 1984); doi: 10.1117/12.939298
Show Author Affiliations
E. Wintner, Massachusetts Institute of Technology (United States)
Technical University of Vienna (Austria)
J. G. Fujimoto, Massachusetts Institute of Technology (United States)
E. P. Ippen, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 0452:
Spectroscopic Characterization Techniques for Semiconductor Technology I
Robert S. Bauer; Fred H. Pollak, Editor(s)

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