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Proceedings Paper

In Situ Characterization And Non Solar Applications Of Semiconductor Liquid Junctions
Author(s): Micha Tomkiewicz
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Paper Abstract

In the first part of this paper we describe some non-solar possible applications of semiconductor -liquid junction methodologies. These include: etching, photoetching, growth of a passivation layer, detection of metallic corrosion, electrochromic display devices, photodeposition of metals on semi-conductors and insitu characterization of semiconductor bulk properties. In the second part, we describe some of the methodologies used to characterize the semiconductor-liquid junctions. These include methods that were borrowed from electrochemistry and solid state photovoltaic devices, in addition to more specific methods based on electric field modulation of system's response such as impedance, electroreflectance and modulated photoluminescence.

Paper Details

Date Published: 10 May 1984
PDF: 10 pages
Proc. SPIE 0452, Spectroscopic Characterization Techniques for Semiconductor Technology I, (10 May 1984); doi: 10.1117/12.939296
Show Author Affiliations
Micha Tomkiewicz, Brooklyn College of CUNY (United States)

Published in SPIE Proceedings Vol. 0452:
Spectroscopic Characterization Techniques for Semiconductor Technology I
Robert S. Bauer; Fred H. Pollak, Editor(s)

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