Share Email Print

Proceedings Paper

Characterization Of Deep Impurities In GaAs By Photoluminescence
Author(s): T. Nishino; Y. Fujiwara; A. Kojima; Y. Hamakawa
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have measured systematically low-temperature photoluminescence spectra associated with deep acceptors due to 3d transition metals in GaAs bulk crystals in order to get some basic knowledge necessary for the characterization of these deep acceptors and related impurities or defects in GaAs. A series of the 3d transition metals, Cr, Mn, Fe, Ni and Cu, in GaAs have been studied, the luminescence spectra showing some characteristic emission lines for each transition metal in the near-infrared region. These results provide a spectroscopic characterization method for the identification of these impurities in GaAs. Analysis of the luminescence data indicates the formation of various complexes including a transition metal with another defect or shallow impurity. The in-depth profiles of these deep center luminescence intensities have been measured for the cases of Cr and Ni, the results indicating the usefulness of the photoluminescence technique for the characterization of the in-depth profiles of shallow impurities and defects such as an arsenic vacancy. In particular, the in-depth profile of the Cr-related luminescence line in annealed GaAs:Cr has been studied to investigate the distribution of such defects in GaAs crystals.

Paper Details

Date Published: 10 May 1984
PDF: 7 pages
Proc. SPIE 0452, Spectroscopic Characterization Techniques for Semiconductor Technology I, (10 May 1984); doi: 10.1117/12.939284
Show Author Affiliations
T. Nishino, Osaka University (Japan)
Y. Fujiwara, Osaka University (Japan)
A. Kojima, Osaka University (Japan)
Y. Hamakawa, Osaka University (Japan)

Published in SPIE Proceedings Vol. 0452:
Spectroscopic Characterization Techniques for Semiconductor Technology I
Robert S. Bauer; Fred H. Pollak, Editor(s)

© SPIE. Terms of Use
Back to Top