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Proceedings Paper

Sexafs Studies Of Nickel Silicide Nucleation On Si(111)
Author(s): F Comin; J. E Rowe; P. H. Citrin
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Paper Abstract

The direct structure determination of the silicide formed from < 1 monolayer of Ni deposited on room temperature Si(111) leads to a model for silicide growth and interface formation. The model forms a basis for understanding many of the photoemission, ion scattering, and microscopy results in this coverage regime.

Paper Details

Date Published: 27 March 1984
PDF: 10 pages
Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); doi: 10.1117/12.939187
Show Author Affiliations
F Comin, Bell Laboratories (United States)
J. E Rowe, Bell Laboratories (United States)
P. H. Citrin, Bell Laboratories (United States)


Published in SPIE Proceedings Vol. 0447:
Science with Soft X-Rays
Roger W. Klaffky; F. J. Himpsel, Editor(s)

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