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Proceedings Paper

Photoelectron Diffraction: Present Applications And Future Prospects
Author(s): Stephen D Kevan
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Paper Abstract

The technique of photoelectron diffraction is reviewed with special emphasis on comparisons with LEED and SEXAFS in surface structural determinations. The review is intended to serve as a guide in choosing photoelectron diffraction over these other techniques. The application of the various data acquisition modes to well-defined systems as well as to more complex overlayer structures is demonstrated. In particular, the potential of photo-electron diffraction in structural determinations of molecular and multi-site overlayer systems is emphasized.

Paper Details

Date Published: 27 March 1984
PDF: 8 pages
Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); doi: 10.1117/12.939183
Show Author Affiliations
Stephen D Kevan, Bell Laboratories (United States)

Published in SPIE Proceedings Vol. 0447:
Science with Soft X-Rays
Roger W. Klaffky; F. J. Himpsel, Editor(s)

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