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Proceedings Paper

Reflectivity And Roughness Of Layered Synthetic Microstructures
Author(s): O J Petersen; J M Thorne; L V Knight; T W Barbee
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Paper Abstract

The effect of uncorrelated roughness on the reflectivity of layered synthetic microstructures (LSM's) is studied. A computer code which includes uncorrelated roughness is developed allowing the subtraction of roughness from experimental measurements. This allows the use of LSM's to measure the optical constants of materials in the x-ray region of the spectrum. The method is applied to an V/C LSM to measure the resonance correction to the atomic factor, f', across the vanadium K-absorption edge.

Paper Details

Date Published: 27 March 1984
PDF: 7 pages
Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); doi: 10.1117/12.939175
Show Author Affiliations
O J Petersen, Brigham Young University (United States)
J M Thorne, Brigham Young University (United States)
L V Knight, Brigham Young University (United States)
T W Barbee, Stanford University (United States)

Published in SPIE Proceedings Vol. 0447:
Science with Soft X-Rays
Roger W. Klaffky; F. J. Himpsel, Editor(s)

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