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Proceedings Paper

Performance Of Multilayer Dispersion Elements From 80 To 500 eV
Author(s): R J Bartlett; D R Kania; W J Trela; E Kallne; P Lee; E Spiller
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Paper Abstract

We have measured the reflectivity of several multilayer dispersion elements between 80 and 500 eV. Two samples of ReW-C and one of Ni-C with 2d spacing of approximately 70 a and 150 A . were tested at angles of incidence between 10 to 80°. Measurements were made by fixing the incident and reflected angles (Bragg) and scanning the photon energy. Theoretical analyses of these multilayers have also been made and the results are compared with the experimental measurements.

Paper Details

Date Published: 27 March 1984
PDF: 4 pages
Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); doi: 10.1117/12.939174
Show Author Affiliations
R J Bartlett, Los Alamos National Laboratory (United States)
D R Kania, Los Alamos National Laboratory (United States)
W J Trela, Los Alamos National Laboratory (United States)
E Kallne, JET Joint Undertaking (England)
P Lee, Ball Aerospace Systems Division (United States)
E Spiller, IBM Thomas J. Watson Research Center (United States)

Published in SPIE Proceedings Vol. 0447:
Science with Soft X-Rays
Roger W. Klaffky; F. J. Himpsel, Editor(s)

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