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Proceedings Paper

Image Quality Improvement On Variable Spatial-Rotation High Resolution Electron Micrograph By Optical Means
Author(s): X. Shen; S. H. Zheng; F. H. Li
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Paper Abstract

Using synthetic holograms made by optical and digital method deconvolutions for high resolution electron micrographs of spatial rotational variant system have been developed. This makes possible the restoration of the limited diffraction resolution of the electron microscope.

Paper Details

Date Published: 15 January 1988
PDF: 6 pages
Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939129
Show Author Affiliations
X. Shen, Shanghai Institute of Mechanical Engineering (China)
S. H. Zheng, Academia Sinica (China)
F. H. Li, Academia Sinica (China)


Published in SPIE Proceedings Vol. 0673:
Holography Applications
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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