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Proceedings Paper

The Study Of Speckle Pattern And Surface Roughness Measurement With Image Processing Technique
Author(s): Zhang Qing-chuan; Xu Bo-qin; Wu Xiao-ping
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Paper Abstract

Digital image processing technique for investigating the statistical properties of speckle pattern and measuring surface roughness is described firstly. With the aid of Model-75 Image Processing System, a speckle pattern can be processed within a minute.

Paper Details

Date Published: 15 January 1988
PDF: 8 pages
Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939094
Show Author Affiliations
Zhang Qing-chuan, University of Science and Technology of China (China)
Xu Bo-qin, University of Science and Technology of China (China)
Wu Xiao-ping, University of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 0673:
Holography Applications
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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