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Proceedings Paper

Electronic Speckle Pattern Interferometry
Author(s): Ole J. Lokberg
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Paper Abstract

The basic principles of electronic speckle pattern interferometry (ESPI) are described, stressing its close similarity to hologram interferometry. The technique's applications for vibration and deformation testing within industrial and medical research are outlined. Future developments are discussed.

Paper Details

Date Published: 15 January 1988
PDF: 8 pages
Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939087
Show Author Affiliations
Ole J. Lokberg, The Norwegian Institute of Technology (Norway)


Published in SPIE Proceedings Vol. 0673:
Holography Applications
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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