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Proceedings Paper

Optical Testing Using A Point Diffraction Holographic Interferometer
Author(s): Zhou Wanzhi; Lu Zhenwu
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Paper Abstract

A new interferometer, the Point Diffraction Holographic Interferometer (PDHI), is described in this paper, which covers its principle, structure, applications and error analysis. It is shown that this interferometer has some advantages over the conventional Point Diffraction Interferometer (PDI) such as easy alignment and adjustable visibility. It can be used for routine optical testing in optical shops or laboratories.

Paper Details

Date Published: 15 January 1988
PDF: 4 pages
Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939076
Show Author Affiliations
Zhou Wanzhi, Changchun Institute of Optics and Fine Mechanics (China)
Lu Zhenwu, Changchun Institute of Optics and Fine Mechanics (China)

Published in SPIE Proceedings Vol. 0673:
Holography Applications
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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