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Proceedings Paper

Use Of Fringe Scanning Method In Electron Holographic Interferometry
Author(s): Toyohiko Yatagai; Katsuyuki Ohmura; Shigeo Iwasaki; Akira Tonomura; Junji Endo; Shuji Hasegawa
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Paper Abstract

Phase analysis technique for reconstructed images of an electron holographic microscope is described. The fringe scanning method is applied to gain high sensitivity in phase detection. An example of measuring a magnetic field of a fine particle is presented. The measurement accuracy in the case of median filtering is about 1/70 fringe.

Paper Details

Date Published: 15 January 1988
PDF: 3 pages
Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939026
Show Author Affiliations
Toyohiko Yatagai, University of Tsukuba (Japan)
Katsuyuki Ohmura, University of Tsukuba (Japan)
Shigeo Iwasaki, National Research Laboratory of Metrology (Japan)
Akira Tonomura, Hitachi, Ltd. (Japan)
Junji Endo, Hitachi, Ltd. (Japan)
Shuji Hasegawa, Hitachi, Ltd. (Japan)


Published in SPIE Proceedings Vol. 0673:
Holography Applications
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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