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Proceedings Paper

Simultaneous Far-Infrared Absorption And Near-Infrared Photoluminescence Spectroscopy Of Bound Excitons
Author(s): B P Clayman; M L. W Thewalt; D Labrie; T Timusk
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Paper Abstract

A system for simultaneously measuring the far-infrared absorption and near-infrared photoluminescence of excitons bound to defects in semiconductors is described. It is based on the integration of a FTIR spectrometer, a cryostat containing both the sample and a cooled bolometer, a laser to generate the excitons, and a grating spectrometer. Modes of operation are described and typical spectra are presented, along with a brief discussion of their significance.

Paper Details

Date Published: 26 September 1986
PDF: 5 pages
Proc. SPIE 0666, Far-Infrared Science and Technology, (26 September 1986); doi: 10.1117/12.938828
Show Author Affiliations
B P Clayman, Simon Fraser University (Canada)
M L. W Thewalt, Simon Fraser University (Canada)
D Labrie, Simon Fraser University (Canada)
T Timusk, McMaster University (Canada)

Published in SPIE Proceedings Vol. 0666:
Far-Infrared Science and Technology
Jerald A. R. Izatt, Editor(s)

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