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Proceedings Paper

Far Infrared Spectroscopy Of Hg1-xCdxTe And Related Materials
Author(s): S Perkowitz
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Paper Abstract

Far infrared measurements between 10 and 250 cm-1 characterize and probe II-VI semiconductor systems of current scientific and technical interest including: the leading infrared detector material Hg1-xCdxTe; the substrate materials CdTe and Cd1-xZnxTe; the magnetic semiconductor Hgl-xMnxTe; and the new HgTe-CdTe superlattice. The advantages, the theory and the technique of these measurements are reviewed and applications to these materials are described.

Paper Details

Date Published: 26 September 1986
PDF: 6 pages
Proc. SPIE 0666, Far-Infrared Science and Technology, (26 September 1986); doi: 10.1117/12.938826
Show Author Affiliations
S Perkowitz, Emory University (United States)


Published in SPIE Proceedings Vol. 0666:
Far-Infrared Science and Technology
Jerald A. R. Izatt, Editor(s)

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