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Proceedings Paper

High-Power 35 GHz Testing Of A Free-Electron Laser And Two-Beam Accelerator Structures*
Author(s): D. B Hopkins; R W Kuenning; F B Selph; A M Sessler; J C Clark; W M Fawley; T J Orzechowsk; A C. Paul; D Prosnitz; E T Scharlemann
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Paper Abstract

At the Lawrence Livermore National Laboratory, a pulsed electromagnetic wiggler has been coupled to the Experimental Test Accelerator forming the Electron Laser Facility. This is a single-pass Free-Electron Laser which, because the wiggler excitation can be varied, can operate over a wide frequency range. Efficiency of conversion of electron beam to micro-wave power is 7%. This new power source is being used in a collateral program for deve-loping and testing structures suitable for a Two-Beam Accelerator. The Two-Beam Accelerator shows much promise for achieving the high average accelerating gradients, e.g., >250 MV/m, required in such next-generation electron accelerators as 1 TeV on 1 TeV linear colliders. In this paper, the results of recent tests characterizing the Free-Electron Laser are summarized. Also, progress in the fabrication and testing of key Two-Beam Accelerator hardware components are reviewed. Finally, Two-Beam Accelerator problem areas are discussed.

Paper Details

Date Published: 21 October 1986
PDF: 13 pages
Proc. SPIE 0664, High Intensity Laser Processes, (21 October 1986); doi: 10.1117/12.938684
Show Author Affiliations
D. B Hopkins, University of California (United States)
R W Kuenning, University of California (United States)
F B Selph, University of California (United States)
A M Sessler, University of California (United States)
J C Clark, University of California (United States)
W M Fawley, University of California (United States)
T J Orzechowsk, University of California (United States)
A C. Paul, University of California (United States)
D Prosnitz, University of California (United States)
E T Scharlemann, University of California (United States)


Published in SPIE Proceedings Vol. 0664:
High Intensity Laser Processes
John A. Alcock, Editor(s)

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