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Proceedings Paper

Simultaneous Laser Beam Profiling And Scaling Using Diffraction Edge Waves (DEW)
Author(s): Pierre Langlois; Roger A. Lessard
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Paper Abstract

A simple method of laser beam profiling using a scanning knife-edge is presented. Instead of monitoring the nonobstructed part of the beam as is usually done, the photo-detector is placed completely outside the beam and measures the light intensity of the DEW. Thus the spatial profile of very small Gaussian beams is obtained directly on an oscilloscope without any inversion procedure. By using the DEW emitted by another beam focused through a grating it is also possible to get a spatial calibration scale.

Paper Details

Date Published: 25 November 1986
PDF: 7 pages
Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); doi: 10.1117/12.938632
Show Author Affiliations
Pierre Langlois, National Research Council Canada (Canada)
Roger A. Lessard, Universite Laval (Canada)


Published in SPIE Proceedings Vol. 0661:
Optical Testing and Metrology
Chander Prakash Grover, Editor(s)

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