Share Email Print
cover

Proceedings Paper

Surface Texture Measurement By Computer Vision
Author(s): Y. J. Chao; C. Lee; M. A. Sutton; W. H. Peters
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A fully automated, non-contacting, full field method is presented to measure the surface roughness parameters using a computer vision system and image processing techniques. The texture features, namely, coarseness, contrast and roughness are extracted from digitized images of standard surface roughness comparator plates and correlated with the arithmetic average roughness (Ra) of the surface. The vision system offers a fast and accurate method for the on-line automated surface roughness inspection of machined components.

Paper Details

Date Published: 25 November 1986
PDF: 5 pages
Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); doi: 10.1117/12.938630
Show Author Affiliations
Y. J. Chao, University of South Carolina (United States)
C. Lee, University of South Carolina (United States)
M. A. Sutton, University of South Carolina (United States)
W. H. Peters, University of South Carolina (United States)


Published in SPIE Proceedings Vol. 0661:
Optical Testing and Metrology
Chander Prakash Grover, Editor(s)

© SPIE. Terms of Use
Back to Top