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Proceedings Paper

Optical Metrology In Length And Mechanical Standards
Author(s): G. D. Chapman
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Paper Abstract

A review is presented of the introduction and development of optical techniques and devices in the broad area of metrology in length and mechanical standards. Emphasis is placed upon those techniques which have been made possible by the use of lasers, or which have substantially increased accuracy and reduced work loads on a routine basis. In particular, the use of optical fourier transform techniques in metrology applied to disciplines as diverse as standards, engineering, plasma physics, and biology are explored.

Paper Details

Date Published: 25 November 1986
PDF: 7 pages
Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); doi: 10.1117/12.938620
Show Author Affiliations
G. D. Chapman, National Research Council of Canada (Canada)


Published in SPIE Proceedings Vol. 0661:
Optical Testing and Metrology
Chander Prakash Grover, Editor(s)

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