Share Email Print

Proceedings Paper

Photometric Ordering Of Ordinary Moire Fringes
Author(s): James R. Pekelsky; Ding Xinhong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A method is described for ordering the fringes in ordinary moire topograms that resolves hill-or-valley ambiguities. A photometric model is used to predict the expected surface brightness for the up and down surface orientation possibilities. Only one of the orientations produces estimates that are consistent with the measured values. The photometric model is based globally upon the moire geometry, and locally upon the surface reflectance properties. Topograms of test objects and human subjects are presented to illustrate the principle of photometric ordering.

Paper Details

Date Published: 25 November 1986
PDF: 12 pages
Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); doi: 10.1117/12.938596
Show Author Affiliations
James R. Pekelsky, National Research Council of Canada (Canada)
Ding Xinhong, National Research Council of Canada (Canada)

Published in SPIE Proceedings Vol. 0661:
Optical Testing and Metrology
Chander Prakash Grover, Editor(s)

© SPIE. Terms of Use
Back to Top