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Proceedings Paper

IR Material Characterization
Author(s): J C Thuillier
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Paper Abstract

Characterization is an important activity in the field of semiconductors. Many different methods are available using various physical effects. We focus this paper on the transport phenomena and an example of study is given on HgTe/CdTe super lattices.

Paper Details

Date Published: 22 November 1986
PDF: 5 pages
Proc. SPIE 0659, Materials Technologies for Infrared Detectors, (22 November 1986); doi: 10.1117/12.938540
Show Author Affiliations
J C Thuillier, Universite de Dijon (France)

Published in SPIE Proceedings Vol. 0659:
Materials Technologies for Infrared Detectors
Jean Besson, Editor(s)

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