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Proceedings Paper

Generalized Theory Of Electroreflectance With Applications To Materials Characterization
Author(s): J W Garland; P M Raccah
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Paper Abstract

A systematic study of the electrolyte electroreflectance lineshape in semiconducting alloys rich in defects has shown the necessity of generalizing the theory to include effects resulting from the interaction of the modulating electric field with local lattice instabilities and with polarizable charged defects. This generalization permits one to understand and use fully lineshapes previously considered pathological and incomprehensible. It has extended considerably the usefulness of electroreflectance and now provides detailed information on the role of specific defects such as stacking faults or antisites in the behavior of materials in device structures. This is particularly attractive, given the simplicity of the technique.

Paper Details

Date Published: 22 November 1986
PDF: 12 pages
Proc. SPIE 0659, Materials Technologies for Infrared Detectors, (22 November 1986); doi: 10.1117/12.938535
Show Author Affiliations
J W Garland, University of Illinois at Chicago (United States)
P M Raccah, University of Illinois at Chicago (United States)

Published in SPIE Proceedings Vol. 0659:
Materials Technologies for Infrared Detectors
Jean Besson, Editor(s)

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