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Proceedings Paper

Digital Interferogram Analysis And DIN Norms
Author(s): R. Boutellier; R. Zumbrunn
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Paper Abstract

The existing German industrial norms for flat surfaces date back to the precomputer age. To make them suitable for digital interferogram analysis, some refinements and additional definitions are necessary. An algorithm is described giving mathematically unique results that do not differ too much from the existing norms.

Paper Details

Date Published: 20 October 1986
PDF: 7 pages
Proc. SPIE 0656, Contemporary Optical Instrument Design, Fabrication, and Testing, (20 October 1986); doi: 10.1117/12.938468
Show Author Affiliations
R. Boutellier, Kern & Co. (Switzerland)
R. Zumbrunn, Kern & Co. (Switzerland)

Published in SPIE Proceedings Vol. 0656:
Contemporary Optical Instrument Design, Fabrication, and Testing
Leo H. J. F. Beckmann; J. David Briers; Paul R. Yoder, Editor(s)

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